Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM

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Description

Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFMDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um

- Optimized for accepting pin-premounting of TERS-STM probes

8mm tip (Model PT10) is recommended

Sample bias holder for CPII / Innova has connectors to apply an external sample bias voltage

the individual bumps were still well-resolved

in any medium

10Pk DESCRIPTION

One 10-pack of IRIS STM TERS Probes

Cylindrical flat punch

Fingers need not touch the disc

Bruker's SCM-PIC-V2 probe has a Platinum-Iridium coated

Al reflective coating DESCRIPTION

These O-rings feature an unique S-shaped profile and are constructed of flexible silicone rubber material