Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

Low profile flat FIB pin mountDESCRIPTION These special low profile pin mounts are available as flat, as a 90 mount, and with specific angles ideally suited to accommodate specimens with small working distances in FIB, DualBeam and CrossBeam systems. Made out of aluminum. Fully compatible with standard pin stub mounts (pin 3. 2mm diameter) for sample storage and transport. These mounts can be used directly in FEI and TESCAN systems with the standard pin length and ZEISS LEO

300: Pitch 85µm

1GPa (PE) DESCRIPTION

PELCO® FIB Lift-Out TEM Grids

4mm 5051-CP-1 ESD Safe

Tipevaluation software provides on-command "worst case" probeshape diagnosis based on scanning of this roughness sample

Dimensions of 25 TEM grid version: 35 x 35 x 6

They enable direct deposition and in situ observations of dynamic reactions over a wide temperature range

671-300-AU - Ultrathin Carbon on Quantifoil®

5 x 2mm slot

and 3 MESP-HM-V2 probes

pin type lid

and individually numbered