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PELCO® Double 1/2" FIB Sample and Grid HolderDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

Replacement scanner springs for all V and VLH type scanners DESCRIPTION

Screws used are 1-72 x 1/8 Pan Head

PDMS Gel Sample

661-400-CU-100 - Quantifoil®

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PVDF And Pelco® CF Polyamide tweezers are ideal for forensic

The solution:

Sharp Conductive Single Crystal Diamond Probes

Ra= Roughness Average Film Thickness: Resilient

fast curing cyanoacrylate type adhesive which can be used as a cleaner alternative to wax for mounting samples to glass for TEM/FIB thinning procedures

5396-NM PELCO® Flat Tip 125

PELCO® TEM Grid Vacuum Desiccator

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