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Description

Springloaded Vise ClampDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

5 Tip Radius (Nom): 8 Tip Set Back (Nom): 12

This kit is used to mount most commercially available afm probes onto pre-aligned substrates for easy installation and alignment in the afm+ and nanoIR systems

wide temperature range

PELCO® Silicon Nitride Support Films are available in four window sizes combined with either 8

for Transmission Electron Microscopy Grids

Can also be used to bond thin samples together for cross section procedures

5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtIr Back Side Coating: Reflective PtIr

AFM Workstation and Accessories

xSol 17 High Load Berkovich

With the defined size and pitch of the holes in the Quantifoil® one can use automated electron microscopy for the first time

- Topography imaging in PeakForce Tapping

PDMS-SOFT-2-12M

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