Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

All-In-OneAFM Probe with 4 Different Cantilevers for Various Applications DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS AFM Probe with 4 Different Cantilevers for Various Applications Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping non contact mode. The rotated tips allow for more symmetric

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 15 Tip Radius (Max): <10 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3

A low melting point adhesive for moderate stress machining processes

16151 - Specimen Mount

Conveniently grasp the grooved head of SEM pin stubs with 12

Fold-up insert which accepts 8 specimen mounts: ø12

The SHR75 probe has a single hydrophobic diamond-like carbon extratip at the apex of Gold coated silicon etched probe

Each of the reference specimens consists of two high purity elements that have an atomic number difference of 1

Mica Substrates for AFM

1µm - From 1

Ø25 x 6mm x M4

Alexander J

The PELCO Low Profile SEMClip™ Specimen Mounts have been designed for high tilt and short working distance imaging applications

Exchange/Return Notes