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Description

SSRM-SMPL-OXDESCRIPTION Unmounted Oxide sample. PLEASE NOTE: Sample cross sectioning by cleaving or polishing is required. Resolution Qualification Structure RQ04 The imec CAMS resolution qualification structures consist of a thin uniform layer of SiO2 confined between highly doped grown poly Si and implanted Si. The RQ04 standard has an average thickness of 0. 40. 1nm and is ideally suited to determine the resolution of electrical probes or for imaging

High quality probe manufactured at Bruker AFM Probes

Unmounted p-type staircase SSRM sample

refelctive coating DESCRIPTION

and a magnetic moment of 0

- Quantity 1

These springs supply tension to the AFM optical head

REQUIRES a minimum of one-day installation/training (Model ITCSA)which must be purchased separately when purchased with any other on-siteinstallation/training package (Models ITCS or ITCS3)

See the cantilever orientation diagram here

order INCL-3

EDGEEC-V2-NOPOT

Tips with 1 nm nominal end radius

110kHz (Fluid)

Exchange/Return Notes