Tin Spheres on Carbon, Low Magnification

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Tin Spheres on Carbon, Low MagnificationDESCRIPTION SEM Resolution Test Specimens; Tin on Carbon Tin spheres on carbon a very useful for SEM, FESEM, FIB astigmatism correction due to their nearly perfect round shape. Tin on carbon is also used instead of gold on carbon where gold is not allowed in the SEM, FESEM or FIB, such as in semiconductor applications. The round tin spheres are particularly useful for testing image quality, distortion, contrast, brightness and probe size. Available in

7 Tip Radius (Nom): 10 Tip Radius (Max): 15 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 12

Width x Thickness 53013 Plastic Tweezer wafer 112mm Glass Filled Delrin® (POM) 2

The entire stub is coated with ~20nm of Au:Pd to ensure conductivity on all samples

Non-Magnetic Sample Holder for CP-II DESCRIPTION

Supplied with M4 screw

Tipevaluation software provides on-command "worst case" probeshape diagnosis based on scanning of this roughness sample

making TEM support films or grids hydrophilic using air

16114-4-20 - PELCO SEMClip™

50nm on 50µm frame thickness with 9 each 0

21 ea of the Ø6mm AFM discs

Good electrical conductivity

100 markings