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Description

SSRM-SMPL-PDESCRIPTION Unmounted p type staircase SSRM sample. PLEASE NOTE: Sample cross sectioning by cleaving or polishing is required. IMEC Calibration Structure CS04 SiB Silicon p type <100> calibration structure, B doped on a p type substrate Total thickness: 6 um Works best with SSRM DIA probes. n type staircase (SSRM SMPL N) and Oxide sample (SSRM SMPL OX) also available separately.

4 N/m DESCRIPTION

The DDLTESP-V2 probe provides:

and other characterization applications

ScanAsyst-Air-HPI Super Sharp Probes

PDMS Gel Sample

~ 1e-13EMU

5º Tip Radius (Nom): 8 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25

"Six Month PeakForce QNM Evaluation Kit

This probe is also available with an Aluminum reflex coating as model CONTV-A

5 Tip Radius (Nom): 2 Tip Radius (Max): 12 Tip Set Back (Nom): 5 Tip Set Back( RNG): 3 - 7

10e5 enhancement is achievable routinely with the TERS-AFM probes on the TERS-SMPL using Innova-IRIS and tuning fork FM feedback

The doped diamond coating is used to harden the tip in applications that require both increased wear resistance and a conductive tip